Prof. Dr.-Ing. W. Peukert
Vorlesungsankündigung
Zeit und Ort:
Tuesday 12.15-13.45, KS II
Thursday 16.15-17.45, KS II (exercises in tandem with lecture; every 2nd week only)
First lecture:
20.10.2016, 16.15, KS II
Purpose:
The lecture introduces the modern techniques of disperse systems characterization in chemical engineering. General principles for the judgment of characterization methods and measuring procedures will be treated. Based on these ideas the most important techniques for nano and micro scaled particle system characterization (particle size, surface, material, charge) are presented. Furthermore some important methods for product characterization of dispersed systems (e.g. rheology, flow behavior of powders, color effect, electronical properties etc.) will be shown. The selection of the detailed treated characterization techniques in the lectures can be adapted to the interests of the participants.
| Date |
Topic |
| 18.10.2016 |
Vorbesprechung |
| 20.10.2016 |
Introduction, Materials Properties, Classification, Sampling, Error Sources |
| 25.10+27.10.16 |
Definition and Determination of Particle Distribution, Size and Shape |
| 03.11.+08.11.16 |
Principles Optics and Diffraction I; Exercise 1 |
| 10.11.+15.11.16 |
Principles Optics and Diffraction II; Exercise 2 |
| 17.11.16 |
Diffraction, Rayleigh-, Mie scattering |
| 22.11.16 |
Static (SLS) and dynamic light scattering (DLS) |
| 24.11.16 |
Exercise 3; Lab visit at devices |
| 29.11.16 |
Color and its measurement, UV-Vis, Fluorescence Spectroscopy |
| 01.12.16 |
Infrared and Raman spectroscopy including SERS and SEIRAS |
| 06.12.+08.12.16 |
X-Ray Scattering: Theory and Applications; Exercise 4 |
| 13.12.+15.12.16 |
Nonlinear Optics at Interfaces and its Application; Lab visit and Exercise 5 |
| 20.12.+22.12.16 |
Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) |
| 10.01.17 |
Analytical Ultracentrifugation |
| 12.01.17 |
Electron Microscopy (SEM, TEM); Excercise 6 |
| 17.01.+19.01.17 |
Zetapotential and its measurement; Scanning Mobility Particle Sizer (SMPS) |
Supervisor of the lecture:
Dr. Björn Braunschweig
Telefon: 09131-85-29580
bjoern.braunschweig@lfg.fau.de
Raum: 0.234
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